Difference between revisions of "Specific test benches"
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* Device parameters extraction (electrical, temperature, etc.) | * Device parameters extraction (electrical, temperature, etc.) | ||
* Magnetic transducers design and characterization | * Magnetic transducers design and characterization | ||
− | * Ultra low-noise and low-power mixed signal | + | * Ultra low-noise and low-power mixed signal ASICs (sensor systems) and ad-hoc test boards design and characterization including ultra-low noise, low frequency, high accuracy measurement |
* Light transducers design and characterization | * Light transducers design and characterization | ||
− | * Ultra-fast | + | * Ultra-fast ASICs (ultra-fast imagers) and ad-hoc test boards design and characterization including ultra-high speed, high accuracy measurement |
* Test bench-orientated FPGA System-on-Chip (SoC) design | * Test bench-orientated FPGA System-on-Chip (SoC) design | ||
* Test bench automatisaton (with LabView) | * Test bench automatisaton (with LabView) |
Revision as of 15:43, 9 September 2016
Expertise
The team has built solid expertise driven by the main research themes (Technologies for CAD, Multiphysics systems and microsystems). Indeed, concerning the modeling activities, we have developed procedures for accurate and exhautive measurements, which are required to perform parameters extraction. Experimental results are systematically compared to theory for model validation. Concerning the integrated circuits developed for sensory applications (magnetic, imaging), we design test boards and experimental procedures that often comply with industrial or medical standards. Therefore, our expertise consists in:
- Device parameters extraction (electrical, temperature, etc.)
- Magnetic transducers design and characterization
- Ultra low-noise and low-power mixed signal ASICs (sensor systems) and ad-hoc test boards design and characterization including ultra-low noise, low frequency, high accuracy measurement
- Light transducers design and characterization
- Ultra-fast ASICs (ultra-fast imagers) and ad-hoc test boards design and characterization including ultra-high speed, high accuracy measurement
- Test bench-orientated FPGA System-on-Chip (SoC) design
- Test bench automatisaton (with LabView)